粉末衍射
微晶
结构精修
衍射
材料科学
纹理(宇宙学)
结晶学
X射线晶体学
三水铝石
高岭石
矿物学
分析化学(期刊)
晶体结构
化学
光学
物理
冶金
计算机科学
色谱法
图像(数学)
人工智能
作者
B. H. O’Connor,D.Y. Li,Husin Sitepu
出处
期刊:Advances in x-ray analysis
[International Centre for Diffraction Data]
日期:1991-01-01
卷期号:35 (A): 277-283
被引量:5
标识
DOI:10.1154/s0376030800008922
摘要
Abstract Texture, i.e. preferred orientation (PO), of crystallites can cause serious systematic errors in quantitative analysis of crystalline materials using x-ray powder diffraction (XRPD) data. The singleparameter model of March (1932), proposed by Dollase (1986) for use in powder diffractometry is a promising mathematical formalism for correcting PO in XRPD analysis of uniaxially-oriented specimens. O'Connor et al. (1991) successfully applied the March formula in applying preferred orientation corrections for gibbsites, Al(OH) 3 , using Rietveld pattern-fitting and a line ratio method in which corrections are determined according to the intensity ratios of selected lines. The paper gives an appraisal of the general applicability of the methods considered by Li and O'Connor with particular reference to powder diffraction data for gibbsite, molybdite (MoO 3 ), calcite (CaCO 3 ) and kaolinite specimens. It is shown that some caution should be exercised when using the March formula to describe PO in Rietveld analysis.
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