外推法
放大器
史密斯图表
计算机科学
电阻抗
非线性系统
电子工程
阻抗匹配
人工智能
算法
数学
工程类
电气工程
统计
物理
量子力学
CMOS芯片
作者
Austin Egbert,Charles Baylis,Robert J. Marks
标识
DOI:10.1109/tmtt.2022.3209700
摘要
Amplifier design, both in traditional approaches and real-time circuit optimization, greatly benefits from fast and thorough extraction of information from measurement data. Using only a few performance samples at varying impedances, deep learning image completion techniques can be utilized to extrapolate an entire set of Smith chart load-pull contours. In addition to speeding nonlinear device characterizations, this extrapolation can be performed in an iterative fashion for use as a circuit optimization algorithm with a very low number of measurements. The techniques of this work have been tested in the measurement of a nonlinear, large-signal amplifier. The load impedance can be estimated with a typical error of < 0.1 linear units using as few as seven impedances and yields even better accuracy with larger sample sizes.
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