摩擦电效应
有机发光二极管
静电放电
材料科学
故障率
制作
光电子学
汽车工程
电气工程
电压
工程类
可靠性工程
复合材料
图层(电子)
替代医学
病理
医学
作者
Hyun Sung Park,Hyeseok Na,Hyeondo Park,Soo‐Young Park,Hyun Soo Shin,Ara Cho,Yu-Deok Seo,Yongjo Kim
摘要
Triboelectric discharging failure is one of the major quality issues of QD‐OLED display, which is the top priority failure item in the QD‐OLED manufacturing process. In order to prevent electrostatic discharge (ESD) failure of the QD‐OLED, triboelectric discharging phenomena of the full panel size should be assessed and proper precautions should be taken before the mask tape‐out. In this paper, ESD failure mechanism during the thin film fabrication process is investigated by using the numerical analysis and verified by experiments. ESD failure criterion of the QD‐OLED devices is characterized by using the spider mask. ESD failure rate of QDOLED displays and the electric field strength of the model are compared to establish the reliable ESD prediction model. For the first time, full panel scale ESD failure evaluation methodology is developed, and the electromagnetic behavior of the accumulated charges in the display panel is explored. Based on the newly developed methodology, ESD robust QD‐OLED panel design is suggested and experimentally verified. Finally, we achieved zero ESD defects during the production process for the QD‐OLED.
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