卡西米尔效应
卡西米尔压力
物理
曲面(拓扑)
凝聚态物理
原子力显微镜
材料科学
分子物理学
原子物理学
光学
经典力学
纳米技术
几何学
数学
作者
Naoki Yoshida,Kazuhiko Higashino,Kazuhisa Sueoka
标识
DOI:10.7567/jjap.55.08nb20
摘要
Abstract We have performed the measurement of Casimir force between a spherical Au tip and an atomically flat Si(111)-(7 × 7) surface at tip–sample distances ranging from 15 to 50 nm in an ultrahigh vacuum of 1.5 × 10 −8 Pa by frequency-modulation atomic force microscopy. Atomically flat Si(111) surfaces provided by the ultrahigh-vacuum condition and a degassed Au tip reduce the contact potential difference that must be compensated. These experimental conditions led to the elucidation of the distance dependence of the Casimir force down to the distance of 15 nm. The observed distance dependence still follows a theory provided by Chen et al. [ Phys. Rev. A 74 , 022103 (2006) ] within these distances.
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