肖特基二极管
欧姆接触
二极管
材料科学
光电子学
电流(流体)
氢
偏压
宽禁带半导体
肖特基势垒
电压
灵敏度(控制系统)
分析化学(期刊)
化学
纳米技术
电气工程
物理
电子工程
热力学
有机化学
工程类
图层(电子)
色谱法
作者
Suku Kim,B. S. Kang,F. Ren,K. Ip,Young-Woo Heo,D. P. Norton,S. J. Pearton
摘要
Pt/ZnO Schottky diodes show changes in forward current of 0.3 mA at a forward bias of 0.5 V or alternatively a change of 50 mV bias at a fixed forward current of 8 mA when 5 ppm of H2 is introduced into a N2 ambient at 25 °C. The rectifying current–voltage (I–V) characteristic shows a nonreversible collapse to Ohmic behavior when as little as 50 ppm of H2 is present in the N2 ambient. At higher temperatures, the recovery is thermally activated with an activation energy of ∼0.25 eV. This suggests that introduction of hydrogen shallow donors into the ZnO is a contributor to the change in current of the diodes.
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