Laser measuring interferometer with wavelength 1,06μm and 0,63μm for optical components testing

The opportunity to use the compact high-stable interferometer for testing of optical materials homogeneity, in particular, laser and nonlinear crystals, Q-switchers and others is analyzed. The interferometer is based on modified Michelson scheme with using corner cubes and works with laser sources of different visible and infrared wave lengths. The analyzes and processes of interferometric picture visibility functions for using laser sources with different mode radiation are discussed. As it shown the laser source for interferometer may be not only one mode laser but a laser with some modes which has a periodical visibility function. In the presented interferometer the measurements of wave fronts distortions are realized with using of one mode He-Ne laser with wavelength radiation 0,63 μm and some modes YAG:Nd3+ on 1,06 μm. The comparison of measurements results showed good repeatability and repetitions. It's shown that sensitive of this interferometer to transmitted wave front quality is about λ/10 on parameter peak to valley (PV) error representing the highest and lowest points, more good then 0.02-0.03 λ on parameter root mean square (RMS) deviations from plane front of radiation and some angular seconds to value of optical wedge.