材料科学
纳米压印光刻
微尺度化学
纳米尺度
纳米技术
平版印刷术
聚合物
纳米结构
收缩率
光电子学
复合材料
制作
医学
数学教育
替代医学
数学
病理
作者
Shady Sayed,P. Ravi Selvaganapathy
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2021-09-07
卷期号:32 (50): 505301-505301
被引量:2
标识
DOI:10.1088/1361-6528/ac244d
摘要
Nanoimprint lithography (NIL) is an emerging technology to form patterns and features in the nanoscale. Production of nanoscale patterns is challenging particularly in the sub-50nm range. Pre-stressed polymer films with embedded microscale pattern can be miniaturized by shrinking induced due to thermal stress release. However, when pre-stressed films are thermally nanoimprinted with sub-micron features and shruken, they lose all the topographical features due to material recovery. Here we report a new approach that prevents recovery and allows retention of shrunken patterns even at the scale of <50 nm. We have discovered that when the shrinking process is mechanically constrained in one direction, the thermal treatment only relieves the stress in the orthogonal direction leading to a uniaxial shrinkage in that direction while preserving the topographical features. A second step, with the constraint in the orthogonal direction leads to biaxial shrinkage and preservation of all of the topographical features. This new technique can produce well defined and high resolution nanostructures at dimensions below 50 nm. The process is programmable and the thermal treatment can be tuned to shrink features to various dimension below the original imprint which we use to produce tunable and gradient plasmonic structures.
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