阴极发光
材料科学
仿形(计算机编程)
薄膜
光电子学
纳米技术
计算机科学
发光
操作系统
作者
B.S. Witkowski,M. Łukasiewicz,E. Wolska,K. Kopalko,B.J. Kowalski,E. Guziewicz,M. Godlewski
标识
DOI:10.12693/aphyspola.119.675
摘要
We employ scanning electron microscopy and cathodoluminescence for evaluation of uniformity of ZnCoO films obtained by the atomic layer deposition.Cathodoluminescence quenching by Co ions allows us to detect (regions of weaker light emission) Co accumulations, with the resolution limited by diffusion length of secondary carriers.
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