透射电子显微镜
扫描电子显微镜
化学气相沉积
显微镜
材料科学
电子束诱导沉积
金属有机气相外延
分析化学(期刊)
沉积(地质)
光谱学
电子显微镜
扫描透射电子显微镜
常规透射电子显微镜
高分辨率透射电子显微镜
纳米技术
化学
光学
复合材料
有机化学
外延
生物
古生物学
沉积物
量子力学
物理
图层(电子)
作者
Marcus Tornberg,Carina B. Maliakkal,Daniel Jacobsson,Reine Wallenberg,Kimberly A. Dick
标识
DOI:10.1017/s1431927622000769
摘要
Abstract The world of environmental microscopy provides the possibility to study and analyze transformations and reactions during realistic conditions to understand the processes better. We report on the design and development of a metal-organic chemical vapor deposition (MOCVD) system integrated with an environmental transmission electron microscope intended for real-time investigations of crystal growth. We demonstrate methods for achieving a wide range of precisely controlled concentrations of precursor gas at the sample, as well as for calibrating the sample partial pressure using the pressure measured elsewhere in the microscope column. The influences of elevated temperature and reactive gas within the pole-piece gap are evaluated with respect to imaging and spectroscopy. We show that X-ray energy-dispersive spectroscopy can be strongly affected by temperatures beyond 500C, while the spatial resolution is largely unaffected by heat and microscope pressure for the relevant conditions. Finally, the influence of the electron beam on the investigated processes is discussed. With this work, we aim to provide crucial input in the development of advanced in situ electron microscopy systems for studies of complex reactions in real time under realistic conditions, for instance as used during formation of semiconductor crystals.
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