Dynamics of Negative Capacitance induced by Ferroelectric Switching in Ferroelectric-Resistor Circuit
作者
Yulong Dong,Danyang Chen,Ni Zhong,Jingquan Liu,Chun‐Gang Duan,Xiuyan Li
标识
DOI:10.1109/edtm50988.2021.9421055
摘要
The dynamics of negative capacitance (NC) in ferroelectric-resistor (FE-R) circuit is discussed on the basis of electrostatics and Kolmogorov-Avrami-Ishibashi model, followed by its experimental confirmation. Both formulation and experiment results suggest that slower charge compensation than ferroelectric switching is the key to obtain the NC effect. These results provide new insights into engineering the NC effects in FeFET.