钻石
空位缺陷
氮气
显微镜
电流(流体)
材料科学
光电子学
氮空位中心
量子
显微镜
光学
物理
电气工程
核磁共振
工程类
量子力学
复合材料
作者
Samuel J. Karlson,Pauli Kehayias,Jennifer M. Schloss,Andrew C. Maccabe,David F. Phillips,Guoqing Wang,Paola Cappellaro,Danielle Braje
出处
期刊:Proceedings
日期:2024-10-23
卷期号:84918: 282-287
标识
DOI:10.31399/asm.cp.istfa2024p0282
摘要
Abstract Wide-field magnetic imagers using nitrogen-vacancy (NV) centers in diamond yield high-resolution images for various applications, including magnetic field imaging (MFI) of electronics. Despite the ongoing successes of this emerging technique for passively interrogating electronics components (including failure analysis troubleshooting), most of the focus has been on sensing DC and low-frequency currents, due to the technical challenges associated with measuring higher-frequency magnetic fields. Here, we overcome these existing challenges and adapt a recently developed technique for sensing MHz-frequency AC fields, a “quantum frequency mixing” approach. We demonstrate the instrument’s capabilities by imaging the current through a fabricated spiral test structure at various frequencies with a ~1 mm2 field of view. Finally, we discuss anticipated future applications in electronics interrogation and failure analysis for this imaging technique.
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