欧姆接触
放大器
电气工程
材料科学
物理
计算机科学
光电子学
纳米技术
工程类
CMOS芯片
图层(电子)
作者
Gregg H. Jessen,Kelson D. Chabak,Andrew Green,Neil Moser,Jonathan P. McCandless,Kevin Leedy,Antonio Crespo,Steve Tetlak
标识
DOI:10.1109/csics.2017.8240464
摘要
In this work, we provide early insight into the combined tradespace for both power switching and RF applications afforded by the high critical, electric-field strength of β-Ga 2 O 3 . MOSFETs formed by homoepitaxial growth of β-Ga 2 O 3 films doped with Sn, Si, and Ge on bulk substrates have been characterized electrically. Several key milestones have been achieved such as enhancement-mode operation > 600 V, low ohmic contact resistance <; 0.2 Ω·mm, and RF power gain in the GHz regime. These results show great promise for monolithic and hybrid integration of RF amplifiers and switch technologies.
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