铜互连
对偶(语法数字)
材料科学
计算机科学
纳米技术
涂层
图层(电子)
文学类
艺术
作者
M. Hussein,S. Sivakumar,R. Brain,Brian Beattie,P. Nguyen,M. I. Fradkin
标识
DOI:10.1109/iitc.2002.1014874
摘要
In this paper, we present and discuss a novel approach to dual damascene patterning based on the invention of SLAM (Sacrificial Light Absorbing Material). We will focus on dual damascene patterning problems that led to the invention of SLAM, and present a side-by-side comparison of the patterning performance of SLAM-assisted dual damascene patterning and a Bottom Anti-Reflective Coating (BARC), the industry's primary approach. SLAM-assisted dual damascene patterning is an enabling technology for Intel's 130 nm technology and beyond.
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