通量
电子束处理
材料科学
退火(玻璃)
辐照
光电子学
辐射损伤
三联结
辐射
电子
半导体
原子物理学
物理
光学
核物理学
复合材料
作者
Zujun Wang,Yexiang Xue,Yanwu Xie,Xiufang Cui,Tongxuan Jia,Qianli Jiao,Xu Nie,Shankun Lai
标识
DOI:10.1016/j.nima.2021.165763
摘要
The experiments of the GaInP/GaAs/Ge triple junction solar cells (3JSCs) irradiated by 1MeV and 10 MeV electrons at the electron accelerator facility were presented. The radiation effects on the GaInP/GaAs/Ge 3JSCs induced by different energy electrons at high fluence up to 5 × 1016 e/cm 2 were investigated. The I–V curves degraded with the increasing electron fluence were presented. The degradations of the radiation sensitive parameters such as the open-circuit voltage (Voc), the short-circuit current (Isc), the maximum power (Pmax), and the external quantum efficiency versus electron fluence were analyzed. The degradations of the Voc, Isc, and Pmax induced by 1MeV and 10 MeV electrons were compared. The annealing tests after electron irradiation about 3 months show no obvious recovery. The degradation mechanisms of the radiation sensitive parameters are also demonstrated.
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