钒
微晶
氧气
分析化学(期刊)
扫描电子显微镜
氧化钒
材料科学
氧化物
电子显微镜
化学
冶金
复合材料
光学
色谱法
物理
有机化学
作者
Roy H. Geiss,R.L. Ladd,K. R. Lawless
出处
期刊:Proceedings ... annual meeting, Electron Microscopy Society of America
[Cambridge University Press]
日期:1971-08-01
卷期号:29: 212-213
标识
DOI:10.1017/s0424820100065110
摘要
Detailed electron microscope and diffraction studies of the sub-oxides of vanadium have been reported by Cambini and co-workers, and an oxidation study, possibly complicated by carbon and/or nitrogen, has been published by Edington and Smallman. The results reported by these different authors are not in good agreement. For this study, high purity polycrystalline vanadium samples were electrochemically thinned in a dual jet polisher using a solution of 20% H 2 SO 4 , 80% CH 3 OH, and then oxidized in an ion-pumped ultra-high vacuum reactor system using spectroscopically pure oxygen. Samples were oxidized at 350°C and 100μ oxygen pressure for periods of 30,60,90 and 160 minutes. Since our primary interest is in the mechanism of the low pressure oxidation process, the oxidized samples were cooled rapidly and not homogenized. The specimens were then examined in the HVEM at voltages up to 500 kV, the higher voltages being necessary to examine thick sections for which the oxidation behavior was more characteristic of the bulk.
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