纳米棒
材料科学
响应度
光电探测器
高分辨率透射电子显微镜
光电子学
比探测率
异质结
纳米晶材料
薄膜
退火(玻璃)
量子效率
光电导性
光学
透射电子显微镜
纳米技术
复合材料
物理
作者
Akshai Shyam,NandaKumar Amal Kaitheri,R. Ramesh,S. Ramasubramanian
标识
DOI:10.1021/acsanm.3c00894
摘要
A simple, inexpensive solution process is used to deposit γ-CuI thin films, and many aspects of the films, such as morphology, crystalline phase, and its optical and electrical properties on annealing are studied. All of the grown films exhibited p-type conductivity and an average transmittance of 70 to 80% in the visible region. The film annealed at 200 °C is observed to be relatively smooth with root-mean-square roughness of 13.25 nm. CuI films annealed at 200 °C displayed a hole mobility of 0.53 cm2/Vs and a hole concentration of 8.36 × 1018 cm–3. Additionally, the potential of γ-CuI as a p-type material for photodetection is explored by fabricating transparent hybrid ultraviolet (UV) photodetectors based on p-CuI/n-ZnO nanorods and p-CuI/n-ZnS/ZnO nanostructures. The high-resolution transmission electron microscopy (HRTEM) image showed that the ZnO nanorods grew as a single crystal along the [001] direction and smaller CuI attached on their surface. A simple sulfurization procedure has created a poly-nanocrystalline ZnS shell layer over the ZnO nanorods. Crucial photodetector parameters such as responsivity, external quantum efficiency, and detectivity are analyzed with different illumination intensities and incident wavelengths. Under self-powered conditions, upon illumination with 372 nm and intensity of 0.25 mW/cm2, the p-CuI/n-ZnO nanorod showed significant responsivity of 25.11 mA/W and detectivity of 4.59 × 1013 Jones. Insertion of the ZnS layer between the ZnO and CuI has enhanced these parameters to 43.85 mA/W and 3.84 × 1014 Jones, respectively. This research underlines the potential of p-type CuI as a transparent, high-performance optoelectronic material.
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