拓扑绝缘体
异质结
铁磁性
X射线光电子能谱
拉曼光谱
材料科学
凝聚态物理
薄膜
外延
光电发射光谱学
结晶度
拓扑(电路)
光电子学
纳米技术
光学
物理
核磁共振
复合材料
数学
图层(电子)
组合数学
作者
X. Liang,Fuhong Chen,Yang Liu,Tingting Yang,Peiyao Xiao,Yuxiang Liu,Zhiwei Wang,Wende Xiao
标识
DOI:10.1088/1361-648x/adb274
摘要
Abstract Heterostructures composed of topological insulators and ferromagnets are predicted to exhibit the quantum anomalous Hall effect (QAHE). The morphology and interfacial structure have a significant impact on the physical properties and transport performance of such heterostructures. Here, we report the epitaxial growth of topological insulators Bi2Se3 and Bi2Te3 thin films on ferromagnetic substrates of Fe3GeTe2 and Fe3GaTe2, respectively. The morphology and composition of the Bi2Se3 and Bi2Te3 thin films were characterized using atomic force microscopy, X-ray photoelectron spectroscopy and Raman spectroscopy. After optimizing the growth parameters, we successfully generated large-area films with high crystallinity, presenting new types of topological insulator-ferromagnet heterojunctions for the pursuit of the QAHE.
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