分子束外延
材料科学
X射线光电子能谱
电子衍射
氮化硼
透射电子显微镜
反射高能电子衍射
成核
外延
分析化学(期刊)
电子能量损失谱
单层
高分辨率透射电子显微镜
结晶学
化学
衍射
纳米技术
图层(电子)
光学
化学工程
物理
色谱法
有机化学
工程类
作者
David F. Storm,Sergey I. Maximenko,Andrew C. Lang,Neeraj Nepal,Tatyana I. Feygelson,Bradford B. Pate,Chaffra A. Affouda,David J. Meyer
标识
DOI:10.1002/pssr.202200036
摘要
Trace amounts of Mg deposited on a diamond (100) substrate surface facilitate the growth of cubic boron nitride (c‐BN) by ion beam‐assisted molecular beam epitaxy. Fourier transform infrared spectroscopy indicates that films grown with Mg are cubic, while those without Mg are either hexagonal BN or lacking measurable cubic or hexagonal signatures. Initiating the growth with 0.005 monolayer equivalent of Mg is sufficient to yield epitaxial films with >99% c‐BN. Reflection high energy electron diffraction, electron energy loss spectroscopy, and X‐Ray photoelectron spectroscopy indicate the surface of the film to be sp 2 ‐bonded BN, consistent with the results of other groups. High‐resolution scanning transmission electron microscopy reveals c‐BN with a high density of stacking faults and twinning. A model is proposed by which Mg locally diminishes the energy barrier to dissociation of the as‐deposited sp 2 ‐bonded BN, facilitating the nucleation of c‐BN.
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