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60 积分 2023-09-24 加入
Standard wafer with programed defects to evaluate the pattern inspection tools for 300-mm wafer fabrication for 7-nm node and beyond
23小时前
待确认
High-NA EUV defectivity inspection: overview and challenges
23小时前
已完结
Novel technologies in coater/developer to improve the defectivity for advanced EUV patterning materials
20天前
已完结
Fast and accurate automatic wafer defect detection and classification using machine learning based SEM image analysis
1个月前
已完结
A holistic approach of EUV mask inspection, defect classification, and disposition for 2nm logic manufacturing
1个月前
已完结
Development of standard samples with programmed defects for evaluation of pattern inspection tools
1个月前
已完结
Standard wafer with programed defects to evaluate the pattern inspection tools for 300-mm wafer fabrication for 7-nm node and beyond
1个月前
已完结
Enhanced EUV photolithography control for overcoming defectivity challenges
1个月前
已完结
Direct yield prediction from SEM images
1个月前
已完结
Towards robust defect inspection in advanced node semiconductors via continual learning
2个月前
已完结
Future prospects of computer-aided design (CAD) – A review from the perspective of artificial intelligence (AI), extended reality, and 3D printing
6个月前
已采纳
An effective feature learning approach using genetic programming for crab age classification
6个月前
已采纳
Synthesis and characterization of novel Cu3Bi3S7 nanoparticle by combustion using green fuel for photocatalytic degradation and electrochemical sensing applications
6个月前
已采纳
A visual interaction consensus approach for fuzzy social network with trust propagation
6个月前
已采纳
Parameter calibration method of clustered-particle logic concrete DEM model using BP neural network-particle swarm optimisation algorithm (BP-PSO) inversion method
6个月前
已采纳
MCNN-DIC: A mechanical constraints-based digital image correlation by a neural network approach
6个月前
已采纳
Hessian-based weighted guided image filtering
6个月前
已采纳
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