Lv31
366 积分 2020-08-08 加入
Improvement of fluorine attack induced word-line leakage in 3D NAND flash memory
21分钟前
待确认
The anisotropic size effect of the electrical resistivity of metal thin films: Tungsten
37分钟前
已完结
3-D NAND Technology Achievements and Future Scaling Perspectives
1小时前
已完结
Trends and Future Challenges of 3D NAND Flash Memory
1小时前
已完结
Reliability of NAND Flash Arrays: A Review of What the 2-D–to–3-D Transition Meant
3小时前
已完结
Device and integration technologies for VLSI in post-Moore era
3小时前
已完结
13.7 A 1Tb Density 3b/Cell 3D-NAND Flash on a 2YY-Tier Technology with a 300MB/s Write Throughput
3小时前
已完结
Innovative Barrier Metal-Less Metal Gate Scheme Leading to Highly Reliable Cell Characteristics for 8th Generation 512Gb 3D NAND Flash Memory
3小时前
已完结
3D NAND Flash Status and Trends
3小时前
已完结
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