Lv2
142 积分 2020-07-18 加入
Negative Gate Bias Induced $V_{\mathrm{t}\mathrm{h}}$ Instability in SiC MOSFET: Role of Body Diode Conduction
1天前
待确认
Degradation of 4H-SiC MOSFET body diode under repetitive surge current stress
1天前
已完结
Study of Gate Bias Voltage for Preventing Threshold Shift of SiC–MOSFET Body Diode during Transient Temperature Measurements
1天前
已完结
Characterization of 4H-SiC PMOSFET with P+ Poly-Si Gate
1天前
已完结
Investigation Into the Third Quadrant Characteristics of Silicon Carbide MOSFET
15天前
已完结
Analyzing the Changes in the Third Quadrant Characteristics of SiC MOSFET Induced by Threshold Drift
15天前
已完结
Practical investigation of the gate bias effect on the reverse recovery behavior of the body diode in power MOSFETs
15天前
已完结
Practical investigation of the gate bias effect on the reverse recovery behavior of the body diode in power MOSFETs
15天前
已完结
Investigation on Degradation of 1200-V Planar and Trench SiC MOSFET Under Surge Current Stress of Body Diode
15天前
已完结
Development and Analysis of 6500V SiC Power MOSFET
15天前
已关闭
皖公网安备34019202002308
