Lv11
50 积分 2025-10-11 加入
Recovery of Bias-Stress Ionized Igzo/SiO2 Interface States Via Cryogenic Relaxation
4小时前
求助中
Threshold voltage reliability in flexible amorphous In–Ga–ZnO TFTs under simultaneous electrical and mechanical stress
4小时前
已完结
In-situ sulfur anion doping for defect passivation and stability enhancement in ZnSnO thin-film transistors
3个月前
已完结
Efficient Oxygen‐Vacancy Suppression and Electrical Stabilization of Solution‐Processed In2O3:Q (Q = S, Se) Thin‐Film Transistor with Chalcogen Alloying
4个月前
已完结
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