| 标题 |
Threshold voltage reliability in flexible amorphous In–Ga–ZnO TFTs under simultaneous electrical and mechanical stress |
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| DOI | |
| 其它 |
期刊:Flexible and printed electronics 作者:Pablo Toledo; M.L. Hernández-Pichardo; I. Garduño; José Luis Hernández-López; F.J. Hernandez-Cuevas; et al 出版日期:2022-05-19 |
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(2025-6-4)