Lv6
1900 积分 2022-03-16 加入
Strain and Stability of Ultrathin Ge Layers in Si/Ge/Si Axial Heterojunction Nanowires
10天前
已完结
Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy
10天前
已完结
Local strain measurement in a strain-engineered complementary metal-oxide-semiconductor device by geometrical phase analysis in the transmission electron microscope
10天前
已完结
Stress Techniques and Mobility Enhancement in FinFET Architectures
1个月前
已完结
Origin of tensile stress in the Si substrate induced by TiN∕HfO2 metal gate/high-k dielectric gate stack
1个月前
已完结
Aluminum oxide from trimethylaluminum and water by atomic layer deposition: The temperature dependence of residual stress, elastic modulus, hardness and adhesion
1个月前
已完结
Origin of tensile stress in the Si substrate induced by TiN∕HfO2 metal gate/high-k dielectric gate stack
1个月前
已完结
Film and surface stress during Al2O3 and AlF3 atomic layer deposition using in situ wafer curvature measurements
1个月前
已完结
New bending mode in SAQP Si fins and its mitigation
1个月前
已完结
Nanoscale Measurement of Stress and Strain by Quantitative High-Resolution Electron Microscopy
1个月前
已关闭
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