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1250 积分 2022-03-16 加入
Imaging, Modeling and Engineering of Strain in Gate-All-Around Nanosheet Transitors
3天前
已完结
Imaging, Modeling and Engineering of Strain in Gate-All-Around Nanosheet Transitors
3天前
已关闭
Imaging, Modeling and Engineering of Strain in Gate-All-Around Nanosheet Transitors
3天前
已关闭
Strain, stress, and mechanical relaxation in fin-patterned Si/SiGe multilayers for sub-7 nm nanosheet gate-all-around device technology
3天前
已完结
Stress evolution analysis of gate-all-around transistors: frontside and backside integration approaches
3天前
已完结
Wafer thinning, bonding, and interconnects induced local strain/stress in 3D-LSIs with fine-pitch high-density microbumps and through-Si vias
3天前
已完结
Investigating Subsurface Defects: 3D EBAC Mapping with Varying Beam Energies
16天前
已完结
Observation of leakage sites in a hafnium silicon oxynitride gate dielectric of a metal-oxide-semiconductor field-effect transistor device by electron-beam-induced current
21天前
已完结
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