Lv6
2100 积分 2022-03-16 加入
Quantitative measurement of displacement and strain fields from HREM micrographs
2天前
已完结
Quantitative measurement of displacement and strain fields from HREM micrographs
23天前
已完结
Mapping Stress/Strain in Nanoscale FinFETs: Implications for Device Design
1个月前
已关闭
Precise and scalable analogue matrix equation solving using resistive random-access memory chips
1个月前
已关闭
Failure Analysis on MIM capacitor failures of RF devices using simple circuit edit passive voltage contrast method
1个月前
已完结
Defect Localization on MIM Capacitor Array by Circuit Edit using Focused-Ion Beam (FIB)
1个月前
已完结
Failure analysis of ASIC controller integrated in embedded flash memory package under biased-HAST reliability failure
3个月前
已完结
New Insights into TDDB in FinFET Based on Strain Analysis at the Atomistic Scale
6个月前
已关闭
Effect of stress interruption on TDDB lifetime during constant voltage stressing in metal-ferroelectric-insulator-semiconductor ferroelectric devices
9个月前
已完结
Nondeterministic dynamics in the η-to-θ phase transition of alumina nanoparticles
10个月前
已完结
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