| 标题 |
[高分]
Nanoscale Measurement of Stress and Strain by Quantitative High-Resolution Electron Microscopy |
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| DOI | |
| 其它 |
期刊:Materials Science Forum 作者:Martin J. Hÿtch; Jean-Luc Putaux; Jean-Michel Pénisson 出版日期:2008-12-04 |
| 求助人 | |
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(2025-6-4)