Lv13
40 积分 2026-01-30 加入
Characterization and Analysis on ESD Robustness of SiC VDMOSFET
1天前
求助中
Main Mechanism Responsible for pGaN Gate Breakdown and Lifetime Projection in GaN HEMTs
2天前
已完结
ESD Human Body Model step stress distributions of GaN HEMTs and the correlation with one level test results
5天前
已完结
Online Degradation Sensing and Mechanism Analysis for p-GaN HEMTs Under Repetitive ESD Stresses Based on Current Transient Feature
5天前
已完结
A Review of GaN HEMT Dynamic ON-Resistance and Dynamic Stress Effects on Field Distribution
6天前
已完结
Dynamic on-Resistance in GaN-on-Si HEMTs: Origins, Dependencies, and Future Characterization Frameworks
6天前
已完结
A review of dynamic effects, reliability and mitigation techniques of AlGaN/GaN HEMTs
6天前
已完结
ESD Human Body Model step stress distributions of GaN HEMTs and the correlation with one level test results
9天前
已完结
Characteristics and Evaluation Approaches of Human-Body-Model Electrostatic Discharge Across Schottky p-GaN Gate HEMTs
9天前
已完结
Investigation on Electrostatic Discharge and Surge Robustness of Silicon Carbide High-Voltage Devices
9天前
已完结
皖公网安备34019202002308
