Lv11
78 积分 2026-06-06 加入
Investigation of the minimum measurement field of view for imaging ellipsometry by using FDTD method
41分钟前
已关闭
Remarkable anisotropic phonon response in uniaxially strained few-layer black phosphorus
2个月前
已完结
Anisotropic optical and electronic properties of two-dimensional layered germanium sulfide
2个月前
已完结
Remarkable anisotropic phonon response in uniaxially strained few-layer black phosphorus
2个月前
已完结
A fully automatized method for the unambiguous wavelength-by-wavelength determination of the thickness and optical property of a very thin film with a transparent range
2个月前
已完结
Spectroscopic ellipsometry study of dielectric functions of Ag films and chemically deposited layers of Ag nanoparticles on silicon
2个月前
已完结
Thickness dependent optical properties of amorphous/polycrystalline Ga2O3 thin films grown by plasma-enhanced atomic layer deposition
2个月前
已完结
Beyond the bulk: probing the EUV optical constants of nanoscale amorphous silicon films
2个月前
已关闭
Optical modeling of SiOx thin films for physicochemical property measurement by spectroscopic ellipsometry
2个月前
已完结
Optical and interfacial layer properties of SiO2 films deposited on different substrates
2个月前
已完结
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