Lv1
40 积分 2022-08-12 加入
(Invited) P-Type and N-Type Channeling Ion Implantation of SiC and Implications for Device Design and Fabrication
1个月前
已完结
Improvement on short-circuit ability of SiC super-junction MOSFET with partially widened pillar structure
2个月前
已完结
Burn-out failure analysis of SiC MOSFET power device after HTRB
3个月前
已完结
SiC Super-Junction MOSFET robustness assessment and method to improve avalanche capability
3个月前
已完结
Investigation on Improving Short-Circuit Characteristic of 1200-V Planar-Gate SiC MOSFETs Using Enhanced N-Buffer Design
3个月前
已完结
An N-type JTE assisted field ring termination for 1200 V SiC MOSFET with increased reliability robustness
3个月前
已完结
Impact of electron and hole trapping on gate reliability of planar SiC MOSFETs
4个月前
已完结
Optimizing the PECVD Process for Stress-Controlled Silicon Nitride Films: Enhancement of Tensile Stress via UV Curing and Layered Deposition
5个月前
已完结
Temperature Dependent Reverse Recovery Characterization of SiC MOSFETs Body Diode forSwitching Loss Estimation In a Half-Bridge
6个月前
已完结
Plastic ratcheting induced cracks in thin film structures
7个月前
已完结
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