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80 积分 2024-03-01 加入
Time-Dependent Degradation Mechanism of 1.2 kV SiC MOSFET Under Long-Term High-Temperature Gate Bias Stress
2天前
已完结
Temperature Dependence and Postirradiation Annealing Response of the $1/f$ Noise of 4H-SiC MOSFETs
2天前
已完结
Deep-subwavelength broadband underwater sound absorption: Modeling, optimization, and mechanism elucidation
23天前
已完结
Reconfigurable silicon photonics extreme learning machine with random non-linearities as neural processor and physical unclonable function
25天前
已完结
1/ f noise model for extracting bulk trap density in scaled metal oxide semiconductor field effect transistors
25天前
已关闭
The observation of Gaussian distribution and origination identification of deep defects in AlGaN/GaN MIS-HEMT
3个月前
已完结
Origins of Low-Frequency Noise and Interface Traps in 4H-SiC MOSFETs
3个月前
已完结
Investigating the impact of temperature variations on the device parameters of Gaussian Doped FinFETs
3个月前
已完结
Efficient Lindblad synthesis for noise model construction
3个月前
已完结
The Charge-Based Flicker Noise Model for HEMTs
3个月前
已完结
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