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80 积分 2024-03-01 加入
Mis‐Specification Analysis of Nonlinear Degradation Models Based on Wiener Process
10天前
已完结
Time-Dependent Degradation Mechanism of 1.2 kV SiC MOSFET Under Long-Term High-Temperature Gate Bias Stress
1个月前
已完结
Temperature Dependence and Postirradiation Annealing Response of the $1/f$ Noise of 4H-SiC MOSFETs
1个月前
已完结
Deep-subwavelength broadband underwater sound absorption: Modeling, optimization, and mechanism elucidation
2个月前
已完结
Reconfigurable silicon photonics extreme learning machine with random non-linearities as neural processor and physical unclonable function
2个月前
已完结
1/ f noise model for extracting bulk trap density in scaled metal oxide semiconductor field effect transistors
2个月前
已关闭
The observation of Gaussian distribution and origination identification of deep defects in AlGaN/GaN MIS-HEMT
4个月前
已完结
Origins of Low-Frequency Noise and Interface Traps in 4H-SiC MOSFETs
5个月前
已完结
Investigating the impact of temperature variations on the device parameters of Gaussian Doped FinFETs
5个月前
已完结
Efficient Lindblad synthesis for noise model construction
5个月前
已完结
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