Lv41
568 积分 2023-06-11 加入
Research progress of single event effect and reinforcement technology of SiC power metal-oxide-semiconductor field-effect transistors
2小时前
求助中
Impact of Heavy-Ion Flux on the Single-Event Leakage Current of SiC Power MOSFETs
2小时前
已关闭
Leakage Current Mechanisms in Silicon Carbide MOSFETs - A Review
4小时前
已完结
Analysis on two breakdown failure mechanisms of silicon carbide MOSFET devices with abnormally increased leakage current at low voltage
4小时前
已完结
Heavy-Ion-Induced Gate–Source Damage at High Drain Bias in SiC Power MOSFET
4小时前
已关闭
Wide-Bandgap Semiconductors for Radiation Detection: A Review
1个月前
已完结
Radiation‐Tolerant Electronic Devices Using Wide Bandgap Semiconductors
1个月前
已完结
Review—Opportunities in Single Event Effects in Radiation-Exposed SiC and GaN Power Electronics
1个月前
已完结
A Review of SiC Sensor Applications in High-Temperature and Radiation Extreme Environments
1个月前
已完结
Wide-Bandgap Semiconductors for Radiation Detection: A Review
1个月前
已完结
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