Lv3
390 积分 2022-09-14 加入
Scanning moiré fringe imaging by scanning transmission electron microscopy
3小时前
求助中
Moiré Fringe Method via Scanning Transmission Electron Microscopy
3小时前
待确认
Noise behavior in SiGe devices
7个月前
已完结
Noise in Nanoscale Semiconductor Devices
7个月前
已关闭
FINFET technology featuring high mobility SiGe channel for 10nm and beyond
7个月前
已完结
In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation
7个月前
已完结
Fin Shape Impact on FinFET Leakage With Application to Multithreshold and Ultralow-Leakage FinFET Design
8个月前
已完结
V<inf>T</inf> implant energy impacting DIBL and punch-through effects of nano-node n-channel FinFETs on SOI wafers
8个月前
已完结
Optimization of fin profile and implant in bulk FinFET technology
8个月前
已完结
Gate Oxide Short Defect Model in FinFETs
9个月前
已完结
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