Lv3
380 积分 2022-09-14 加入
Stress-Related Local Layout Effects in FinFET Technology and Device Design Sensitivity
6个月前
已完结
Single-defect phonons imaged by electron microscopy
7个月前
已完结
Quantitative measurement of strain field in strained-channel-transistor arrays by scanning moiré fringe imaging
7个月前
已完结
Scanning moiré fringe imaging by scanning transmission electron microscopy
7个月前
已关闭
Moiré Fringe Method via Scanning Transmission Electron Microscopy
7个月前
已完结