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Trap Profiling Based on Frequency Varied Charge Pumping Method for Hot Carrier Stressed Thin Gate Oxide Metal Oxide Semiconductors Field Effect Transistors
1个月前
已完结
Hot-electron induced passivation of silicon dangling bonds at the Si(111)/SiO2 interface
2个月前
已完结
Improved positive bias temperature instability of n-type vertical C-shaped-channel nanosheet FET by forming gas annealing
3个月前
已关闭
Insight into Suppressed Positive Bias Temperature Instability by Forming Gas Annealing on n-type Vertical C-shaped Channel Nanosheet FET
3个月前
已关闭
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