Lv1
96 积分 2025-03-08 加入
Impact of Hf: Zr Atomic Ratio on Polarization Reversal and Write/Erase Stability in HfO2-ZrO2 Thin Films
1个月前
已完结
Laser-based FinFET hot-carrier degradation resolved in time-domain
4个月前
已完结
Trap Profiling Based on Frequency Varied Charge Pumping Method for Hot Carrier Stressed Thin Gate Oxide Metal Oxide Semiconductors Field Effect Transistors
5个月前
已完结
Hot-electron induced passivation of silicon dangling bonds at the Si(111)/SiO2 interface
6个月前
已完结
Improved positive bias temperature instability of n-type vertical C-shaped-channel nanosheet FET by forming gas annealing
8个月前
已关闭
Insight into Suppressed Positive Bias Temperature Instability by Forming Gas Annealing on n-type Vertical C-shaped Channel Nanosheet FET
8个月前
已关闭
皖公网安备34019202002308
