| 标题 |
[高分]
Trap Profiling Based on Frequency Varied Charge Pumping Method for Hot Carrier Stressed Thin Gate Oxide Metal Oxide Semiconductors Field Effect Transistors |
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| DOI | |
| 其它 |
期刊:Journal of Nanoscience and Nanotechnology 作者:Pyungho Choi; Hyunjin Kim; Sangsub Kim; Soonkon Kim; Reza Javadi; et al 出版日期:2016-04-26 |
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(2025-6-4)