| 标题 |
Analysis and optimization of Cu/SiO2 hybrid bonding interfacial reliability based on FEA and GABP-NSGA Ⅱ algorithm |
| 网址 | |
| DOI | |
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:Li Zhao; Wenchao Tian; Shaoli Huang; Zhiqiang Chen; Yongkun Wang 出版日期:2025-06-14 |
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(2025-6-4)