| 标题 |
Modeling the Performance and Reliability of Two-Dimensional Semiconductor Transistors |
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| DOI | |
| 其它 |
期刊:2023 International Electron Devices Meeting (IEDM) 作者:T. Knobloch; D. Waldhoer; M. R. Davoudi; A. Karl; P. Khakbaz; et al 出版日期:2024-02-08 |
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(2025-6-4)