| 标题 |
Biaxial bending strength of TGV glass substrates in ring-on-ring tests: Stress analysis and experimental investigation |
| 网址 | |
| DOI | |
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:M.-Y. Tsai; C. T. Chang; W.-Y. Chen; T. Onishi 出版日期:暂无 |
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(2025-6-4)