| 标题 |
Normalized differential conductance to study current conduction mechanisms in MOS structures |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:T.H. Nouibat; Z. Messai; D. Chikouch; Z. Ouennoughi; N. Rouag; et al 出版日期:2018-12-01 |
| 求助人 | |
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(2025-6-4)