| 标题 |
A CNN-based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE International Symposium on Semiconductor Manufacturing conference proceedings 作者:Kazunori Imoto; Tomohiro Nakai; Tsukasa Ike; Kosuke Haruki; Yoshiyuki Satō 出版日期:2018-12-01 |
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(2025-6-4)