| 标题 |
Studying the effect of CuInSe2 quantum dot size on the distribution of surface defects using positron annihilation spectroscopy |
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| DOI | |
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:A.E. Elsheikh; M. Ghali; M.M. Mosaad; T. Sharshar 出版日期:2025 |
| 求助人 | |
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(2025-6-4)