| 标题 |
Coordinated optimization of visual inspection and facility layout in PCB manufacturing under bottleneck drift: A DSE-YOLO and EH-SLP-GA framework |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Manufacturing Systems 作者:Liang Liu; Yusong Liu; Qian Sun; Yashun Yang; Ke Chen 出版日期:2026-07-23 |
| 求助人 | |
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(2025-6-4)