| 标题 |
Experimental investigation of time dependent dielectric breakdown and failure mechanism for Hf0.5Zr0.5O2 ferroelectric field effect transistors |
| 网址 | |
| DOI | |
| 其它 |
期刊:Solid-State Electronics 作者:Ran Cheng; Xinze Li; Yiqin Zeng; Xiao Yu; Yue Peng; et al 出版日期:2023-07-01 |
| 求助人 | |
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(2025-6-4)