| 标题 |
STEM SerialED: achieving high-resolution data for ab initio structure determination of beam-sensitive nanocrystalline materials |
| 网址 | |
| DOI | |
| 其它 |
期刊:IUCrJ 作者:Pascal Hogan-Lamarre; Yi Luo; Robert Bücker; R. J. Dwayne Miller; Xiaodong Zou 出版日期:2023-11-09 |
| 求助人 | |
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(2025-6-4)