| 标题 |
Defect-Engineered PECVD-Grown hBN Enabling Effective Charge Trapping in IGZO Synaptic Transistors |
| 网址 | |
| DOI | |
| 其它 |
期刊:ACS Applied Electronic Materials 作者:Doyun Lee; Woojin Park; Si Hyeong Lee; Junhuk Kim; Junyeong Gu; et al 出版日期:2026-10-01 |
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(2025-6-4)