| 标题 |
Temperature Dependence of the Defect States in LWIR (100) and (111)B HgCdTe Epilayers for IR HOT Detectors |
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| 其它 |
期刊:Journal of Electronic Materials 作者:Krzysztof Murawski; Kinga Majkowycz; Jan Sobieski; M. Kopytko; Piotr Martyniuk 出版日期:2024-07-03 |
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(2025-6-4)