| 标题 |
Scanning spreading resistance microscopy for p – n junction and carrier distribution analysis in InGaAs/AlGaAs quantum well laser heterostructure |
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| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:D. E. Sviridov; M. R. Butaev; A. Yu. Andreev; I. V. Yarotskaya; M. A. Ladugin; et al 出版日期:2025-11-11 |
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(2025-6-4)