| 标题 |
Observation of Micro-Oxygen Precipitates in the Vicinity of the Oxidation-Induced Stacking Fault Ring and Their Effects on Thin Gate Oxide Breakdown |
| 网址 | |
| DOI | |
| 其它 |
期刊:Japanese Journal of Applied Physics 作者:Hyunsoo Kim; Ki‐Sang Lee; Boyoung Lee; Hak-Do Yoo; Seung-Ho Pyi; et al 出版日期:2001-12-01 |
| 求助人 | |
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(2025-6-4)