| 标题 |
Structural investigation of high‐transmittance aluminum oxynitride films deposited by ion beam sputtering |
| 网址 | |
| DOI | |
| 其它 |
期刊:Surface and Interface Analysis 作者:Paul W. Wang; Jin‐Cherng Hsu; Yung‐Hsin Lin; Huang‐Lu Chen 出版日期:2010-10-20 |
| 求助人 | |
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(2025-6-4)