| 标题 |
Deep learning based defect classification and detection in SEM images: a mask R-CNN approach |
| 网址 | |
| DOI |
10.1117/12.2618178
doi
|
| 其它 |
期刊:Metrology, Inspection, and Process Control XXXVI 作者:Bappaditya Dey; Enrique Dehaerne; Sandip Halder; Philippe Leray; Magdy A. Bayoumi 出版日期:2022-07-12 |
| 求助人 | |
| 下载 | 暂无链接,等待应助者上传 |
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(2025-6-4)