| 标题 |
[高分]
Monitoring thickness changes in GaAs/AlAs partial VCSEL Bragg reflector stacks using optical spectroscopic, x-ray and electron microscopic methods |
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| DOI | |
| 其它 |
期刊:Semiconductor Science and Technology 作者:P J S Thomas; T J C Hosea; D Lancefield; H Meidia 出版日期:2002-08-25 |
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(2025-6-4)