| 标题 |
Abnormal On-Current Degradation Under Non-Conductive Stress in Contact Field Plate Lateral Double-Diffused Metal-Oxide- Semiconductor Transistor With 0.13-μm Bipolar-CMOS-DMOS Technology |
| 网址 | |
| DOI |
10.1109/led.2022.3164475
doi
|
| 其它 |
期刊:IEEE Electron Device Letters 作者:Wei‐Chun Hung; Yu‐Fa Tu; Ting‐Chang Chang; Mao‐Chou Tai; Yung‐Fang Tan; et al 出版日期:2022-04-04 |
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